Anthropological Perspectives on Organizational Culture

ISBN: 9780819194862

出版社: Rowman & Littlefield Pub Inc

出版年: 1994-7

页数: 416

定价: $ 84.19

装帧: HRD

内容简介

This work began in the form of an all-day symposium developed by co-editor Willis E. Sibley on the topic of corporate culture. The editors have compiled papers presented by anthropologists concerned with corporate and organizational culture. Contents: Preface, Willis E. Sibley; ANTHROPOLOGY AND ORGANIZATIONAL CULTURE: PART ONE; ETHNOGRAPHY AND ORGANIZATIONAL CULTURE: PART TWO; Meetings: The Neglected Routine, Helen B. Schwartzman and Rebecca Hanson Berman; Federal Organizational Cultures: Layers and Loci, Shirley J. Fiske; Culture Conflict with Growth: Cases from Silicon Valley, Kathleen Gregory-Huddleston; A Regional Perspective on the Transfer of Japanese Management Practices to the United States, Donald White and Frank Rackerby; Working Here is Like Walking Blindly Into a Dense Forest, Jill Kleinburg; Hollowing of Industrial Ideology: Japanese Corporate Familism in America, Tomoko Hamada and Yujin Yaguchi; Reconstructing Culture Clash at General Motors: An Historical View from the Overseas Assignment, Elizabeth K. Briody and Marietta L. Baba; VOICES FROM THE FIELD: WORKING ORGANIZATIONAL CULTURE: PART THREE; The Corporation as a Part-Culture, Michael Maccoby; Corporate Culture Studies and Anthropology: An Uneasy Synthesis, Jim R. McLeod and J.A. Wilson; Is Culture "Good" in the Microcosm of the Firm, Manning Nash; Corporate Culture on the Rocks, Peter C. Reynolds; Applying Concepts of Corporate Culture to International Business Management, Anthony J. DiBella; ETHICS AND ORGANIZATIONAL CULTURE: PART FOUR; Real World Anthropology: The Anthropologist-Client Relationship, Daniela Weinberg; Corporate Social Responsibility: Economic Rationality Encounters Societal Values, Thomas Vetica; Corporate Culture and Social Responsibility: The Case of Toxic Wastes in a New England Community, June Nash and Max Kirsch; Organizational Culture and the Development Crisis, Riall W. Nolan; Subject Index; Notes on Contributors.